Enterprise Data Catalog Advanced Scanners

Webinar: Leave No Metadata Behind with EDC Advanced Scanners

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Metadata scanners for complex data sources

With Enterprise Data Catalog Advanced Scanners, you can automatically extract the most granular metadata and track data dependencies across data sources.

SOLVE METADATA EXTRACTION AND DATA LINEAGE CHALLENGES

PRODUCT FEATURES

Advanced Scanners: Key features

Improve understanding of data relationships by extracting the most granular metadata across complex systems.

Advanced dependency tracking

Understand every transformation that occurred to the data across sources.

Eliminate “black box” effect

Get a full lineage view of custom apps, mainframe, and legacy systems for end-to-end data flow analysis.

Support for multi-vendor ETL tools

Extract metadata and lineage from tools including IBM InfoSphere DataStage, Microsoft SSIS, and Oracle Data Integrator.

Extract from SQL dialects

Scan both static and dynamic code and get detailed data lineage from SQL dialects and stored procedures.

Extract custom content at scale

Surface metadata from custom code and content in proprietary solutions.

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Intelligent Data Catalog

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DATA SHEET

Informatica Enterprise Data Catalog Advanced Scanners

WEBINAR

Leave No Metadata Behind with EDC Advanced Scanners

Data Sheet

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Ebook

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Webinar

Meet the Experts: Informatica Enterprise Data Catalog 10.5

Solution Brief

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